INNANOMAT Group, Departamento de Ciencia de los Materiales e I,M, y Q,I,, Facultad de Ciencias, Universidad de Cádiz, Campus Río San Pedro, s/n, Puerto Real, Cadiz, 11510, Spain.
Nanoscale Res Lett. 2012 Dec 18;7(1):681. doi: 10.1186/1556-276X-7-681.
The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shaped specimen preparation and electron tomography. We show that conventional 2D measurements of the distribution of QDs are not reliable, and only 3D analysis allows an accurate correlation between the growth design and the structural characteristics.
自组装堆叠量子点 (QD) 的 3D 分布是在各种光电设备中获得最佳性能的关键参数。在这项工作中，我们使用针状样品制备和电子断层扫描的组合程序在 3D 中测量了这种分布。我们表明，QD 分布的常规 2D 测量不可靠，只有 3D 分析才能在生长设计和结构特征之间建立准确的相关性。
