García-Valenzuela A, Diaz-Uribe R
Appl Opt. 1997 Jul 1;36(19):4456-62. doi: 10.1364/ao.36.004456.
The theoretical detection limit on angle deflection measurement when the quasi-critical internal-reflection method is used is calculated and compared with the more common method of using a bicell position-sensitive detector. Simple formulas for the sensitivity and resolution when the system is shot noise limited are given. It is shown that, even though the bicell detector is potentially much more sensitive for wide and well collimated beams, under typical laboratory restrictions, the internal reflection method may be more sensitive and have better resolution. It is argued that the internal-reflection method may be a tool in developing compact sensors based on the optical beam deflection method.
计算了使用准临界内反射法时角度偏转测量的理论检测极限，并与使用双单元位置敏感探测器这种更常见的方法进行了比较。给出了系统受散粒噪声限制时灵敏度和分辨率的简单公式。结果表明，尽管双单元探测器对于宽且准直良好的光束可能具有更高的灵敏度，但在典型的实验室条件限制下，内反射法可能更灵敏且具有更好的分辨率。有人认为，内反射法可能是开发基于光束偏转法的紧凑型传感器的一种工具。
