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利用频域漫反射对双层混浊介质的特性进行量化。

Quantifying the properties of two-layer turbid media with frequency-domain diffuse reflectance.

作者信息

Pham T H, Spott T, Svaasand L O, Tromberg B J

机构信息

Laser Microbeam and Medical Program, Beckman Laser Institute and Medical Clinic, University of California, Irvine, 1002 Health Sciences Road East, Irvine, California 92612-3010, USA.

出版信息

Appl Opt. 2000 Sep 1;39(25):4733-45. doi: 10.1364/ao.39.004733.

Abstract

Noncontact, frequency-domain measurements of diffusely reflected light are used to quantify optical properties of two-layer tissuelike turbid media. The irradiating source is a sinusoidal intensity-modulated plane wave, with modulation frequencies ranging from 10 to 1500 MHz. Frequency-dependent phase and amplitude of diffusely reflected photon density waves are simultaneously fitted to a diffusion-based two-layer model to quantify absorption (mu(a)) and reduced scattering (mu(s)') parameters of each layer as well as the upper-layer thickness (l). Study results indicate that the optical properties of two-layer media can be determined with a percent accuracy of the order of +/-9% and +/-5% for mu(a) and mu(s)', respectively. The accuracy of upper-layer thickness (l) estimation is as good as +/-6% when optical properties of upper and lower layers are known. Optical property and layer thickness prediction accuracy degrade significantly when more than three free parameters are extracted from data fits. Problems with convergence are encountered when all five free parameters (mu(a) and mu(s)' of upper and lower layers and thickness l) must be deduced.

摘要

非接触式频域测量漫反射光用于量化两层组织样浑浊介质的光学特性。辐照源是一个正弦强度调制平面波,调制频率范围为10至1500兆赫兹。将漫反射光子密度波的频率相关相位和幅度同时拟合到基于扩散的两层模型中,以量化每层的吸收系数(μ(a))和约化散射系数(μ(s)')参数以及上层厚度(l)。研究结果表明,对于μ(a)和μ(s)',两层介质的光学特性测定精度分别约为±9%和±5%。当上下层光学特性已知时,上层厚度(l)估计精度可达±6%。当从数据拟合中提取超过三个自由参数时,光学特性和层厚度预测精度会显著下降。当必须推导所有五个自由参数(上下层的μ(a)和μ(s)'以及厚度l)时,会遇到收敛问题。

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