Seong Kibyung, Greivenkamp John E
College of Optical Sciences, University of Arizona, Tucson, Arizona 85721, USA.
Appl Opt. 2008 Dec 10;47(35):6508-11. doi: 10.1364/ao.47.006508.
A method of chromatic aberration measurement is described based on the transmitted wavefront of an optical element obtained from a Mach-Zehnder interferometer. The chromatic aberration is derived from transmitted wavefronts measured at five different wavelengths. Reverse ray tracing is used to remove induced aberrations associated with the interferometer from the measurement. In the interferometer, the wavefront transmitted through the sample is tested against a plano reference, allowing for the absolute determination of the wavefront radius of curvature. The chromatic aberrations of a singlet and a doublet have been measured.
描述了一种基于从马赫-曾德尔干涉仪获得的光学元件的透射波前来测量色差的方法。色差由在五个不同波长下测量的透射波前得出。使用反向光线追迹从测量中去除与干涉仪相关的诱导像差。在干涉仪中，透过样品的波前与平面参考进行比较，从而可以绝对确定波前的曲率半径。已测量了一个单透镜和一个双合透镜的色差。
