Becker Marco, Budich Christian, Deckert Volker, Janasek Dirk
Institute for Analytical Sciences, Bunsen-Kirchhoff-Strasse 11, 44139, Dortmund, Germany.
Analyst. 2009 Jan;134(1):38-40. doi: 10.1039/b816717f. Epub 2008 Nov 10.
A new approach for label-free optical sample detection via surface enhanced Raman spectroscopy (SERS) inside a free-flow electrophoresis (FFE) chip is presented in this work.
本文介绍了一种通过自由流动电泳(FFE)芯片内的表面增强拉曼光谱(SERS)进行无标记光学样品检测的新方法。