通过双正交光谱干涉术实现光学任意波形表征

Optical arbitrary waveform characterization via dual-quadrature spectral interferometry.

作者信息

Supradeepa V R, Leaird Daniel E, Weiner Andrew M

机构信息

School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA.

出版信息

Opt Express. 2009 Jan 5;17(1):25-33. doi: 10.1364/oe.17.000025.

DOI:10.1364/oe.17.000025

PMID:19129869

Abstract

We introduce the use of dual-quadrature spectral interferometry for amplitude and phase characterization of 100% duty factor optical arbitrary waveforms generated via spectral line-by-line pulse shaping. We demonstrate this technique for measurement of optical arbitrary waveforms composed of approximately 30 spectral lines from a 10 GHz frequency comb with 1.4 micros data acquisition time at an average power level of 10 microwatts. We then demonstrate coherent spectral phase measurements of pulses strongly dispersed by propagation over 50 km of optical fiber.

摘要

我们介绍了双正交光谱干涉测量法的应用，用于对通过逐线光谱脉冲整形产生的占空比为100%的光学任意波形进行幅度和相位表征。我们展示了该技术用于测量由10 GHz频率梳中的约30条谱线组成的光学任意波形，在平均功率水平为10微瓦时，数据采集时间为1.4微秒。然后，我们展示了对在50公里光纤中传播而强烈色散的脉冲进行的相干光谱相位测量。