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自组装六边形晶格中晶粒形态的定量分析。

Quantitative analysis of the grain morphology in self-assembled hexagonal lattices.

作者信息

Hillebrand Reinald, Müller Frank, Schwirn Kathrin, Lee Woo, Steinhart Martin

机构信息

Max Planck Institute of Microstructure Physics, Weinberg 2, Halle D-06120, Germany.

出版信息

ACS Nano. 2008 May;2(5):913-20. doi: 10.1021/nn700318v.

Abstract

We present a methodology for the analysis of the grain morphology of self-ordered hexagonal lattices and for the quantitative comparison of the quality of their grain ordering based on the distances between nearest neighbors and their angular order. Two approaches to grain identification and evaluation are introduced: (i) color coding the relative angular orientation of hexagons containing a central entity and its six nearest neighbors, and (ii) incorporating triangles comprising three nearest neighbors into grains or repelling them from grains based on deviations of the side lengths and the internal angles of the triangles from those of an ideal equilateral triangle. A spreading algorithm with tolerance parameters allows single grains to be identified, which can thus be ranked according to their size. Hence, grain size distributions are accessible. For the practical evaluation of micrographs displaying self-ordered structures, we suggest using the size of the largest identified grain as a quality measure. Quantitative analyses of grain morphologies are key to the systematic and rational optimization of the fabrication of self-assembled materials.

摘要

我们提出了一种用于分析自组装六边形晶格晶粒形态的方法,以及一种基于最近邻间距及其角序对晶粒有序度质量进行定量比较的方法。介绍了两种晶粒识别和评估方法:(i)对包含中心实体及其六个最近邻的六边形的相对角取向进行颜色编码,以及(ii)根据三角形边长和内角与理想等边三角形的偏差,将由三个最近邻组成的三角形纳入晶粒或使其与晶粒排斥。一种带有容差参数的扩展算法能够识别单个晶粒,从而可以根据其大小进行排序。因此,可以获得晶粒尺寸分布。对于显示自组装结构的显微照片的实际评估,我们建议使用所识别出的最大晶粒的尺寸作为质量度量。晶粒形态的定量分析是自组装材料制造系统且合理优化的关键。

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