Sasa I S, Hasan A A, Qudeimat M A
Dept of Paediatric Dentistry, University of Texas Health Science Center, San Antonio, TX, USA.
Eur Arch Paediatr Dent. 2009 Jan;10(1):6-10. doi: 10.1007/BF03262659.
This was to prospectively investigate the success and median survival rate of band and loop space maintainers using glass ionomer luting cement for attachment.
A total of 40 children (22 females and 18 males) between the ages of 3.4 and 7.3 years participated in the study. Each patient received only one band and loop space maintainer. For each child, the same paediatric dentist carried out all diagnosis, band selection, and impression taking and appliance cementation. The same dental technician fabricated all appliances. The luting cement used was Ketac-Cem-Maxicap. Regular follow up appointments were scheduled at 4-6 months intervals. Variables, which might have affected the median survival time for the appliances were tested using Log-Rank and Chi-square tests.
40% of the band and loop space maintainers were successful and 57.5% failed during the study period (40 months). The most common cause of failure was decementation (82% of all failed cases). The overall median survival time was 19.9 months. Appliances fitted in the maxillary and mandibular left side of the mouth showed a statistically higher survival rate than those fitted in the right side (maxillary left quadrant = 35 months, mandibular left quadrant = 28 months, maxillary right quadrant = 14 months, mandibular right quadrant = 16 months) (p<0.008).
Although the overall median survival time was clinically acceptable (19.9 months), the failure rate of the band and loop space maintainers in general was high (57.5%). The main reason for failure was decementation of the band. Further studies are required to compare glass ionomer cements with more recent resin modified luting cements.
前瞻性研究使用玻璃离子水门汀黏固的带环及带环圈式间隙保持器的成功率及中位生存期。
共有40名年龄在3.4至7.3岁之间的儿童（22名女性和18名男性）参与了本研究。每名患者仅接受一个带环及带环圈式间隙保持器。对于每个孩子，由同一名儿童牙医进行所有诊断、带环选择、取印模及装置黏固。所有装置均由同一名牙科技师制作。使用的黏固水门汀为Ketac-Cem-Maxicap。定期随访预约安排为每隔4至6个月进行一次。使用对数秩检验和卡方检验对可能影响装置中位生存时间的变量进行测试。
在研究期间（40个月），40%的带环及带环圈式间隙保持器成功，57.5%失败。最常见的失败原因是黏固剂脱落（占所有失败病例的82%）。总体中位生存时间为19.9个月。安装在口腔上颌和下颌左侧的装置显示出比右侧更高的生存率（上颌左象限 = 35个月，下颌左象限 = 28个月，上颌右象限 = 14个月，下颌右象限 = 16个月）（p<0.008）。
尽管总体中位生存时间在临床上是可接受的（19.9个月），但带环及带环圈式间隙保持器的总体失败率较高（57.5%）。失败的主要原因是带环的黏固剂脱落。需要进一步研究以比较玻璃离子水门汀与更新的树脂改良黏固水门汀。
