采用宽带曲折线方法进行微波吸收测量。

Microwave absorption measurements using a broad-band meanderline approach.

作者信息

Tsai C C, Choi J, Cho Sunglae, Lee S J, Sarma B K, Thompson C, Chernyashevskyy O, Nevirkovets I, Ketterson J B

机构信息

Department of Engineering and Management of Advanced Technology, Chang Jung Christian University, Tainan 71101, Taiwan.

出版信息

Rev Sci Instrum. 2009 Feb;80(2):023904. doi: 10.1063/1.3070471.

DOI:10.1063/1.3070471

PMID:19256659

Abstract

We describe a technique that permits broad-band, field-dependent ferromagnetic and electron paramagnetic resonance absorption measurements that is applicable to thin films and patterned micro-/nanostructured arrays and is based on a wire-wound meanderline approach. Techniques to prepare meanderlines and perform microwave measurements are described along with some demonstrations involving an electron paramagnetic resonance calibration/test material, 2,2-diphenyl-1-picryl-hydrazyl, and a ferromagnetic cobalt thin film.

摘要

我们描述了一种技术，该技术允许进行宽带、场依赖的铁磁共振和电子顺磁共振吸收测量，适用于薄膜以及图案化的微/纳米结构阵列，并且基于绕线曲折线方法。文中描述了制备曲折线和进行微波测量的技术，以及一些涉及电子顺磁共振校准/测试材料2,2-二苯基-1-苦基肼和铁磁钴薄膜的演示。