Singh Rajeev, Shakouri Ali
Department of Electrical Engineering, University of California, Santa Cruz, California 95064, USA.
Rev Sci Instrum. 2009 Feb;80(2):025101. doi: 10.1063/1.3072603.
We have designed and fabricated a vacuum-insulated thermostat capable of measuring the thermoelectric properties of thin films from room temperature to 850 K. High speed Seebeck voltage transients are resolved to 200 ns with 63 dB dynamic range in order to directly measure thermoelectric device figure of merit. In-plane Seebeck coefficient probes measure voltage and temperature difference at identical locations with low parasitic contributions. In-plane electrical conductivity measurement is accomplished at high speed to avoid possible Seebeck voltage effect on van der Pauw measurements.
我们设计并制造了一种真空绝热恒温器，能够测量从室温到850 K的薄膜热电性能。高速塞贝克电压瞬变可分辨至200 ns，动态范围为63 dB，以便直接测量热电器件的优值。面内塞贝克系数探头在相同位置测量电压和温差，寄生效应低。面内电导率测量以高速完成，以避免塞贝克电压对范德堡测量可能产生的影响。
