Lewis E R, Petit D, Jausovec A-V, O'Brien L, Read D E, Zeng H T, Cowburn R P
Department of Physics, Imperial College London, Prince Consort Road, London SW7 2BW, United Kingdom.
Phys Rev Lett. 2009 Feb 6;102(5):057209. doi: 10.1103/PhysRevLett.102.057209.
The motion of transverse domain walls (DWs) in thin Permalloy nanowires has been studied by locally detecting the chirality of the moving DW, using a cross-shaped trap acting as a chirality filter. We find that structural changes of the DW occur over a characteristic minimum distance: the "DW fidelity length." The measured field dependence of the fidelity length is in good qualitative agreement with a 1D analytical model and with published results of numerical simulations and experiments. We also demonstrate extension of the fidelity length to meter length scales using a series of filters.
通过使用十字形陷阱作为手性过滤器来局部检测移动磁畴壁（DW）的手性，研究了坡莫合金细纳米线中横向磁畴壁的运动。我们发现，磁畴壁的结构变化发生在一个特征最小距离上：“磁畴壁保真长度”。测量得到的保真长度与场的依赖关系在定性上与一维分析模型以及已发表的数值模拟和实验结果吻合良好。我们还展示了使用一系列过滤器将保真长度扩展到米级长度尺度。
