Measuring domain wall fidelity lengths using a chirality filter.

The motion of transverse domain walls (DWs) in thin Permalloy nanowires has been studied by locally detecting the chirality of the moving DW, using a cross-shaped trap acting as a chirality filter. We find that structural changes of the DW occur over a characteristic minimum distance: the "DW fidelity length." The measured field dependence of the fidelity length is in good qualitative agreement with a 1D analytical model and with published results of numerical simulations and experiments. We also demonstrate extension of the fidelity length to meter length scales using a series of filters.