Ade Harald, Stoll Herman
Department of Physics, NCSU, Raleigh, North Carolina 27695, USA.
Nat Mater. 2009 Apr;8(4):281-90. doi: 10.1038/nmat2399.
Many high-performance materials and novel devices consist of multiple components and are naturally or intentionally nano-structured for optimal properties and performance. To understand their structure-property relationships fully, quantitative compositional analysis at length scales below 100 nm is required, a need that is often uniquely addressed using soft X-ray microscopy. Similarly, the interaction of X-rays with magnetic materials provides unique element-specific contrast that allows the determination of magnetic properties in multi-element antiferromagnetic and ferromagnetic materials. Pump-probe-type experiments can even investigate magnetic domain dynamics. Here we review and exemplify the ability of soft X-ray microscopy to provide information that is otherwise inaccessible, and discuss a perspective on future developments.
许多高性能材料和新型器件由多个组件组成,并且为了实现最佳性能而自然地或有意地制成纳米结构。为了全面理解它们的结构-性能关系,需要在小于100纳米的长度尺度上进行定量成分分析,而这一需求通常只能通过软X射线显微镜来独特地满足。同样,X射线与磁性材料的相互作用提供了独特的元素特异性对比度,从而能够确定多元素反铁磁和铁磁材料中的磁性。泵浦-探测型实验甚至可以研究磁畴动力学。在这里,我们回顾并举例说明了软X射线显微镜提供其他方法无法获得的信息的能力,并讨论了未来发展的前景。