Zhao Weiqian, Tan Jiubin, Qiu Lirong
Opt Express. 2004 Oct 18;12(21):5191-7. doi: 10.1364/opex.12.005191.
Based on the characteristic of a confocal microscope (CM) that the offset of a pinhole along an optical axis changes the axial intensity response phase, a novel tri-heterodyne confocal microscope is built up by dividing the CM measurement light path into three paths, and using three sets of focusing lenses, detectors and pinholes placed behind, on and before the focal plane to form three detection systems, thereby achieving the axial superresolution imaging and high Signal Noise Ratio (SNR) through pairwise heterodyne subtraction of three intensity signals with given phases received by the three detection systems and data processing. Simulation and experimental results indicate that the new tri-heterodyne confocal microscope reduces the full width at the half maximum of CM axial response curve by more than 50%, results in the significant improvement of CM anti-interference capability, and enables CM to be more suitable for high accuracy bipolar absolute measurement of 3D microstructures and surface contours.
基于共聚焦显微镜(CM)的特性,即针孔沿光轴的偏移会改变轴向强度响应相位,通过将CM测量光路分为三条路径,并使用三组聚焦透镜、探测器以及分别置于焦平面后方、焦平面上和焦平面前方的针孔,构建了一种新型三外差共聚焦显微镜,从而形成三个检测系统,通过对三个检测系统接收到的具有给定相位的三个强度信号进行两两外差相减和数据处理,实现轴向超分辨率成像和高信噪比(SNR)。仿真和实验结果表明,新型三外差共聚焦显微镜将CM轴向响应曲线的半高宽减小了50%以上,显著提高了CM的抗干扰能力,使CM更适合于三维微结构和表面轮廓的高精度双极绝对测量。