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双侧拟合减法共聚焦显微镜术

Bilateral fitting subtracting confocal microscopy.

作者信息

Zhao Weiqian, Sheng Zhong, Qiu Lirong, Wang Yun, Shao Rongjun

出版信息

Appl Opt. 2016 Dec 20;55(36):10269-10275. doi: 10.1364/AO.55.010269.

DOI:10.1364/AO.55.010269
PMID:28059245
Abstract

This paper proposes a bilateral fitting subtracting confocal microscopy (BFSCM) based on the optical arrangement of conventional confocal microscopy (CM). BFSCM first uses the data in both sides of a confocal axial response curve, which are very sensitive to the axial position of the sample, for respective linear fitting to obtain two fitting straight lines, and then obtains a difference confocal line by subtraction of the two fitting lines. Finally, it calculates the zero position of the difference confocal line to precisely capture the focus position of the confocal system, and thereby achieving a high-precision measurement of the 3D structure of the sample. The theoretical analyses and experiments indicate that BFSCM can improve the axial resolution, and has anti-interference capability and focusing ability with bipolar absolute zero point tracking, while it does not change the structure and lateral resolution of CM. BFSCM provides a novel method for the improvement of CM axial resolution.

摘要

本文基于传统共聚焦显微镜(CM)的光学布局提出了一种双边拟合相减共聚焦显微镜(BFSCM)。BFSCM首先利用共聚焦轴向响应曲线两侧对样品轴向位置非常敏感的数据进行各自的线性拟合,以获得两条拟合直线,然后通过两条拟合直线相减得到一条差分共聚焦线。最后,计算差分共聚焦线的零位置以精确捕获共聚焦系统的焦点位置,从而实现对样品三维结构的高精度测量。理论分析和实验表明,BFSCM可以提高轴向分辨率,具有双极性绝对零点跟踪的抗干扰能力和聚焦能力,同时不改变CM的结构和横向分辨率。BFSCM为提高CM轴向分辨率提供了一种新方法。

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Bilateral fitting subtracting confocal microscopy.双侧拟合减法共聚焦显微镜术
Appl Opt. 2016 Dec 20;55(36):10269-10275. doi: 10.1364/AO.55.010269.
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