Whitney Kriscinda A, Davis Jeremy J, Shepard Polly H, Bertram David M, Adams Kenneth M
Richard L. Roudebush Veterans Affairs Medical Center, Indianapolis, IN 46202, USA.
Arch Clin Neuropsychol. 2009 May;24(3):263-72. doi: 10.1093/arclin/acp034. Epub 2009 Jul 18.
The relative usefulness of two digit span (DS) variables in detecting negative response bias, as defined by below cut-off performance on the Test of Memory Malingering (TOMM), was examined among primarily middle-aged military veteran outpatients who were judged clinically to be at increased risk for displaying negative response bias on cognitive testing. Digit span variables included DS Age Scaled Score (DS Age SS) and Reliable DS. Findings from this retrospective data analysis (N = 46) suggest that DS Age SS is preferable for use over Reliable DS in predicting TOMM failure. Results of the current study suggest that, particularly if the Wechsler scales are an existing part of the neuropsychological assessment, examination of DS Age SS is an efficient means of detecting negative response bias.
在临床上被判定在认知测试中表现出消极反应偏差风险增加的主要为中年退伍军人门诊患者中，研究了两个数字广度（DS）变量在检测消极反应偏差方面的相对效用，消极反应偏差由低于记忆伪装测试（TOMM）临界表现来定义。数字广度变量包括DS年龄量表得分（DS Age SS）和可靠数字广度（Reliable DS）。这项回顾性数据分析（N = 46）的结果表明，在预测TOMM失败方面，DS年龄量表得分比可靠数字广度更适合使用。当前研究结果表明，特别是如果韦氏智力量表是神经心理学评估的现有组成部分，检查DS年龄量表得分是检测消极反应偏差的有效方法。
