Institute of Mathematics and Physics, University of Technology and Life Sciences, Bydgoszcz, Poland.
Food Addit Contam Part A Chem Anal Control Expo Risk Assess. 2009 May;26(5):726-32. doi: 10.1080/02652030802627764.
Control (crops grown in natural conditions) and Fusarium head blight (FHB) damaged (crops inoculated with Fusarium culmorum conidia) grain of four wheat cultivars was ground and sieved into three fractions of different particle size. A series of blended samples differing in content of damaged material were prepared within fractions and cultivars, and diffuse reflectance spectra recorded within the 200-2500 nm wavelength range. Partial least-squares (PLS) models for the percentage of damaged material in blended samples were built for each of twelve series within different spectral ranges, and the root-mean-squared error of cross-validation (RMSECV) was used for the assessment of model performance. Errors using the models were lowest for the finest fraction independent of spectral range; however, their values depended on the cultivar. RMSECV for the finest fraction averaged over cultivars ranged from a little below 3.0 (when the ultraviolet light sub-range was used or participated with another one) to 8.1% (when only the near infrared (NIR) sub-range was used). For the medium and coarse fractions, averaged errors showed the same tendency of dependence on the sub-range(s); however, with higher values that increased with an increase in particle size. In conclusion, within the different fractions of particle size and spectral ranges, the most sensitive to the presence of damaged material were models developed for the finest fraction and when the ultraviolet light sub-range was used in modelling.
对照(自然条件下生长的作物)和赤霉病(用尖孢镰刀菌分生孢子接种的作物)损伤(接种了尖孢镰刀菌的作物)的四种小麦品种的谷物被研磨并过筛成不同粒径的三个部分。在各部分和品种内制备了一系列在损伤材料含量上存在差异的混合样品,并在 200-2500nm 波长范围内记录漫反射光谱。为每个光谱范围内的十二个系列分别建立了混合样品中损伤材料百分比的偏最小二乘(PLS)模型,并使用交叉验证均方根误差(RMSECV)来评估模型性能。独立于光谱范围的最细部分的模型误差最低;然而,其值取决于品种。在品种之间平均的最细部分的 RMSECV 值略低于 3.0(当使用或与另一个一起使用紫外光子区时)至 8.1%(当仅使用近红外(NIR)子区时)。对于中值和粗值部分,平均误差表现出与子区(s)相同的依赖关系;然而,随着粒径的增加,误差值增加。总之,在不同的粒径部分和光谱范围内,对损伤材料的存在最敏感的是为最细部分开发的模型,并且在建模中使用了紫外光子区。