Urban Knut W, Jia Chun-Lin, Houben Lothar, Lentzen Markus, Mi Shao-Bo, Tillmann Karsten
Institute of Solid State Research and Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons, Research Centre Jülich, 52425 Jülich, Germany.
Philos Trans A Math Phys Eng Sci. 2009 Sep 28;367(1903):3735-53. doi: 10.1098/rsta.2009.0134.
Aberration-corrected transmission electron microscopy allows us to image the structure of matter at genuine atomic resolution. A prominent role for the imaging of crystalline samples is played by the negative spherical aberration imaging (NCSI) technique. The physical background of this technique is reviewed. The especially high contrast observed under these conditions owes its origin to an enhancing combination of amplitude contrast due to electron diffraction channelling and phase contrast. A number of examples of the application of NCSI are reviewed in order to illustrate the applicability and the state-of-the-art of this technique.
像差校正透射电子显微镜使我们能够以真正的原子分辨率对物质结构进行成像。负球差成像（NCSI）技术在晶体样品成像中发挥着重要作用。本文回顾了该技术的物理背景。在这些条件下观察到的特别高的对比度源于电子衍射通道引起的振幅对比度和相位对比度的增强组合。本文回顾了一些NCSI应用的例子，以说明该技术的适用性和现状。
