Department of Materials, Imperial College London, London SW7 2AZ, United Kingdom.
ACS Nano. 2009 Oct 27;3(10):3015-22. doi: 10.1021/nn900922z.
We demonstrate the use of a scanning transmission electron microscope (STEM) equipped with a monochromator and an electron energy loss (EEL) spectrometer as a powerful tool to study localized surface plasmons in metallic nanoparticles. We find that plasmon modes can be influenced by changes in nanostructure geometry and electron beam damage and show that it is possible to delineate the two effects through optimization of specimen preparation techniques and acquisition parameters. The results from the experimental mapping of bright and dark plasmon energies are in excellent agreement with the results from theoretical modeling.
我们展示了一种扫描透射电子显微镜（STEM）的应用，该显微镜配备了单色仪和电子能量损失（EEL）光谱仪，是研究金属纳米粒子中局域表面等离激元的强大工具。我们发现，等离激元模式可以受到纳米结构几何形状和电子束损伤变化的影响，并表明通过优化样品制备技术和采集参数，可以区分这两种效应。实验绘制的亮等离子体能量和暗等离子体能量的结果与理论模型的结果非常吻合。
