Snigirev A, Snigireva I, Kohn V, Yunkin V, Kuznetsov S, Grigoriev M B, Roth T, Vaughan G, Detlefs C
ESRF, B.P. 220, 38043 Grenoble, France.
Phys Rev Lett. 2009 Aug 7;103(6):064801. doi: 10.1103/PhysRevLett.103.064801. Epub 2009 Aug 3.
We report a novel type of x-ray interferometer employing a bilens system consisting of two parallel compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. By closely overlapping such coherent beams, an interference field with a fringe spacing ranging from tens of nanometers to tens of micrometers is produced. In an experiment performed with 12 keV x rays, submicron fringes were observed by scanning and moiré imaging of the test grid. The far field interference pattern was used to characterize the x-ray coherence. Our technique opens up new opportunities for studying natural and man-made nanoscale materials.
我们报道了一种新型的X射线干涉仪，它采用了一种双透镜系统，该系统由两个平行的复合折射透镜组成，每个透镜在相干照明下都会产生一个衍射极限光束。通过紧密重叠这些相干光束，会产生一个条纹间距从几十纳米到几十微米不等的干涉场。在用12keV X射线进行的实验中，通过对测试网格进行扫描和莫尔成像观察到了亚微米级条纹。远场干涉图样被用于表征X射线的相干性。我们的技术为研究天然和人造纳米级材料开辟了新的机会。
