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嵌入外延稀土氧化物中的 Ge 量子阱的包埋体固相外延。

Encapsulated solid phase epitaxy of a Ge quantum well embedded in an epitaxial rare earth oxide.

机构信息

Institute of Electronic Materials and Devices, Leibniz University of Hannover, Appelstrasse 11A, D-30167 Hannover, Germany.

出版信息

Nanotechnology. 2009 Nov 25;20(47):475604. doi: 10.1088/0957-4484/20/47/475604. Epub 2009 Oct 29.

Abstract

An efficient method based on molecular beam epitaxy has been developed to integrate an epitaxial Ge quantum well buried into a single crystalline rare earth oxide. The monolithic heterostructure comprised of Gd2O3-Ge-Gd2O3 grown on an Si substrate exhibits excellent crystalline quality with atomically sharp interfaces. This heterostructure with unique structural quality could be used for novel nanoelectronic applications in quantum-effect devices such as nanoscale transistors with a high mobility channel, resonant tunneling diode/transistors, etc. A phenomenological model has been proposed to explain the epitaxial growth process of the Ge layer under oxide encapsulation using a solid source molecular beam epitaxy technique.

摘要

一种基于分子束外延的高效方法已经被开发出来,用于将外延 Ge 量子阱集成到单晶稀土氧化物中。在 Si 衬底上生长的由 Gd2O3-Ge-Gd2O3 组成的整体异质结构具有原子级陡峭的界面,表现出优异的晶体质量。这种具有独特结构质量的异质结构可用于新型纳米电子应用,如具有高迁移率沟道的纳米尺度晶体管、共振隧穿二极管/晶体管等量子效应器件。已经提出了一种唯象模型来解释使用固态源分子束外延技术在氧化物封装下 Ge 层的外延生长过程。

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