NXP Semiconductors, Innovation & Technology, Eindhoven, the Netherlands.
IEEE Trans Ultrason Ferroelectr Freq Control. 2009 Dec;56(12):2686-92. doi: 10.1109/TUFFC.2009.1359.
The temperature increase of bulk acoustic wave filters at high RF power levels has been investigated. Self-heating due to power dissipation in the filter leads to a nonuniform frequency shift of the insertion loss. At the right filter skirt, self-heating is amplified by the negative temperature coefficient of frequency. We demonstrate that at high RF power levels, this can cause thermal instabilities resulting in an abrupt step in the insertion loss. A novel frequency transformation is introduced to describe the nonuniform frequency shift of the insertion loss as well as the thermal instabilities. A condition for the occurrence of thermal instabilities is derived. It is argued that because of this nonuniform frequency shift at high power levels, accelerated lifetime tests can overestimate the lifetime, if the stress frequency is not compensated for self-heating. Here, the frequency transformation is used to determine the stress frequencies at high RF power levels from low-power S-parameter measurements.
研究了在高射频功率水平下体声波滤波器的温度升高。由于滤波器中的功率耗散导致自热,从而导致插入损耗的频率不均匀漂移。在滤波器的正确裙边处,频率的负温度系数会放大自热。我们证明,在高射频功率水平下,这可能会导致热不稳定性,从而导致插入损耗的突然阶跃。引入了一种新的频率变换来描述插入损耗的不均匀频率漂移以及热不稳定性。推导出了发生热不稳定性的条件。有人认为,由于在高功率水平下这种不均匀的频率漂移,如果不对自热进行频率补偿,那么加速寿命测试可能会高估寿命。在这里,使用频率变换从低功率 S 参数测量确定高射频功率水平下的应力频率。