Heroux L, Newburgh R G, McMahon W J, Hinteregger H E
Air Force Cambridge Research Laboratories,Bedford, Massachusetts 01730, USA.
Appl Opt. 1968 Jan 1;7(1):37-47. doi: 10.1364/AO.7.000037.
Planar and spherical retarding potential analyzers have been studied as detectors of extreme uv (xuv) radiation between 200 A and 1300 A. Current-voltage diagrams (CVD's) are presented for the photoelectrons emitted from the front and rear surfaces of a semitransparent aluminum cathode for the planar analyzer and from the rear surface of an aluminum cathode for the spherical analyzer. The CVD's obtained in planar geometry for the front and rear surface photoelectrons of aluminum are essentially identical for properly prepared films. The analyzers are compared as tools for a simple method of nonoptical spectrometry. The spherical analyzer is shown to be superior to the planar analyzer in spectral discrimination in the xuv. Calculations applicable to the detection of xuv radiation below 600 A in the presence of unfiltered solar radiation are given.
平面和球形减速势分析器已被作为200埃至1300埃极紫外（XUV）辐射的探测器进行了研究。给出了平面分析器中半透明铝阴极前后表面发射的光电子以及球形分析器中铝阴极后表面发射的光电子的电流 - 电压图（CVD）。对于适当制备的薄膜，在平面几何结构中获得的铝前后表面光电子的CVD基本相同。对这两种分析器作为一种简单的非光学光谱法工具进行了比较。结果表明，在XUV光谱鉴别方面，球形分析器优于平面分析器。给出了在存在未过滤太阳辐射的情况下适用于探测600埃以下XUV辐射的计算方法。
