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OSL 法对电子元器件的辐射事故剂量测定。

Radiation accident dosimetry on electronic components by OSL.

机构信息

Institute of Radiological Protection and Nuclear Safety, BP17, 92262 Fontenay-aux-Roses Cedex, France.

出版信息

Health Phys. 2010 Feb;98(2):440-5. doi: 10.1097/01.HP.0000346335.56701.93.

DOI:10.1097/01.HP.0000346335.56701.93
PMID:20065718
Abstract

In the event of large-scale radiation accidents and considering a growing terrorism concern, non-invasive and sufficiently accurate retrospective dosimetry methods are necessary to carry out a fast population triage in order to determine which radiation-exposed individuals need medical treatment. Retrospective dosimetry using different electronic components such as resistors, capacitors, and integrated circuits present on mobile phone circuit boards have been considered. Their response has been investigated with luminescence techniques (OSL, IRSL, and TL). The majority of these electronic components exhibit radiation-induced luminescence signals, and the OSL technique seems the most promising for these materials. Results concerning three types of components that present the most interesting OSL characteristics (in terms of signal annealing and sensitivity) and that are the most often present on mobile phone circuit boards are presented. Preheating effects on OSL signal, sensitization, and dose-response curves from 0.7 to 27 Gy for resistors and from 0.7 to 160 Gy for capacitors and integrated circuits, dose recovery tests, and signal stability 10 h after irradiation have been studied and interests and limits of their use evaluated.

摘要

在大规模辐射事故的情况下,并且考虑到日益增长的恐怖主义担忧,需要非侵入性且足够准确的回溯剂量测定方法,以便对受到辐射的个体进行快速人群分类,以确定哪些需要进行医疗救治。已经考虑使用电阻器、电容器和集成电路等不同电子元件进行回溯剂量测定。已经使用发光技术(OSL、IRSL 和 TL)研究了它们的响应。这些电子元件中的大多数都表现出辐射诱导的发光信号,而 OSL 技术似乎是这些材料中最有前途的。本文介绍了三种类型的组件的结果,这些组件具有最有趣的 OSL 特性(就信号退火和灵敏度而言),并且在移动电话电路板上最常见。研究了电阻器的 OSL 信号、敏化和剂量响应曲线(从 0.7Gy 到 27Gy)以及电容器和集成电路的 OSL 信号、敏化和剂量响应曲线(从 0.7Gy 到 160Gy)的预热效应、剂量恢复测试以及辐照后 10 小时的信号稳定性,并评估了它们的使用的兴趣点和限制。

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