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锕系材料的 X 射线和电子显微镜观察

X-ray and electron microscopy of actinide materials.

机构信息

Lawrence Livermore National Laboratory, Livermore, CA 94550, USA.

出版信息

Micron. 2010 Jun;41(4):336-58. doi: 10.1016/j.micron.2009.12.006. Epub 2009 Dec 30.

Abstract

Actinide materials demonstrate a wide variety of interesting physical properties in both bulk and nanoscale form. To better understand these materials, a broad array of microscopy techniques have been employed, including transmission electron microscopy (TEM), electron energy-loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDXS), high-angle annular dark-field imaging (HAADF), scanning electron microscopy (SEM), wavelength dispersive X-ray spectroscopy (WDXS), electron back scattered diffraction (EBSD), scanning tunneling microscopy (STM), atomic force microscopy (AFM), and scanning transmission X-ray microscopy (STXM). Here these techniques will be reviewed, highlighting advances made in the physics, materials science, chemistry, and biology of actinide materials through microscopy. Construction of a spin-polarized TEM will be discussed, considering its potential for examining the nanoscale magnetic structure of actinides as well as broader materials and devices, such as those for computational magnetic memory.

摘要

锕系材料在体相和纳米尺度上表现出多种多样有趣的物理性质。为了更好地理解这些材料,已经采用了广泛的显微镜技术,包括透射电子显微镜(TEM)、电子能量损失光谱(EELS)、能量色散 X 射线光谱(EDXS)、高角度环形暗场成像(HAADF)、扫描电子显微镜(SEM)、波长色散 X 射线光谱(WDXS)、电子背散射衍射(EBSD)、扫描隧道显微镜(STM)、原子力显微镜(AFM)和扫描透射 X 射线显微镜(STXM)。在这里,将对这些技术进行综述,重点介绍通过显微镜在锕系材料物理学、材料科学、化学和生物学方面取得的进展。将讨论构造自旋极化 TEM 的问题,考虑其用于检查锕系元素纳米级磁结构以及更广泛的材料和器件的潜力,例如用于计算磁存储的材料和器件。

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