Gerhardt U, Rubloff G W
Appl Opt. 1969 Feb 1;8(2):305-8. doi: 10.1364/AO.8.000305.
A near-normal incidence (~6 degrees ) reflectometer system is described that records continuously and directlythe reflectance R(omega) as a range of photon energies is scanned. The system has an absolute error of +/-2 x 10(-2) and a relative error of +/-2 x 10(-5). It incorporates a quartz light pipe rotating at 70 Hz which captures light from the incident and the reflected beam, respectively, during about 20% of its period of rotation in either case. A gating circuit separates the output signal of the photomultiplier into two channels, corresponding to the incident and the reflected beam, respectively. The signal corresponding to the incident beam is kept constant by a servo system which regulates the gain of the photomultiplier. The reflectance is thus proportional to the signal of the second channel, which is recorded as a function of photon energy. Portions of the reflectance spectrum of Ge are given as examples. No trace of a fine structure in the reflectance of Ge below 2 eV is found.
描述了一种近法线入射角(约6度)的反射计系统,该系统在扫描一系列光子能量时能连续且直接地记录反射率R(ω)。该系统的绝对误差为±2×10⁻²,相对误差为±2×10⁻⁵。它包含一根以70Hz旋转的石英光管,在其旋转周期的约20%时间内,分别捕获来自入射光束和反射光束的光。一个门控电路将光电倍增管的输出信号分离到两个通道,分别对应入射光束和反射光束。对应入射光束的信号由一个调节光电倍增管增益的伺服系统保持恒定。因此,反射率与第二个通道的信号成正比,该信号作为光子能量的函数被记录下来。给出了锗反射光谱的部分示例。在低于2eV的锗反射率中未发现精细结构的痕迹。