Raymond O J
Appl Opt. 1970 May 1;9(5):1140-5. doi: 10.1364/AO.9.001140.
The limiting fringe pointing precision obtainable from a scanning two-beam interferometer is calculated. A photoelectric fringe visibility is derived. If this is high, significantly higher precision is obtainable by pointing on a dark fringe rather than a bright fringe. Optimum relative width of the slit used for viewing straight fringes and optimum scan amplitude are calculated for the fixed fringe spacing and fixed slit width cases. Different results are obtained for dark and bright fringes. Results are given in a form enabling rapid experimental optimization of a scanning two-beam interferometer. Experimental measurements show satisfactory agreement with the theory.
计算了扫描双光束干涉仪可获得的极限条纹指向精度。推导了光电条纹可见度。如果该可见度较高，则通过指向暗条纹而非亮条纹可获得显著更高的精度。针对固定条纹间距和固定狭缝宽度的情况，计算了用于观察直条纹的狭缝的最佳相对宽度和最佳扫描幅度。对于暗条纹和亮条纹，得到了不同的结果。结果以一种能够对扫描双光束干涉仪进行快速实验优化的形式给出。实验测量结果与理论结果吻合良好。
