Nikjoo H, Goodhead D T
Division of Cell and Molecular Biology, Medical Research Council, Chilton, Didcot, UK.
Phys Med Biol. 1991 Feb;36(2):229-38. doi: 10.1088/0031-9155/36/2/007.
Monte Carlo track structure methods have been used to illustrate the importance of low-energy electrons produced by low-LET radiations. It is shown that these low-energy secondary electrons contribute substantially to the dose in all low-LET irradiations and are particularly efficient at producing highly localized clusters of atomic damage which may be responsible for a major part of the biological effectiveness of low-LET radiations. The data generated by Monte Carlo track structure techniques and by earlier semi-analytical methods based on the LET concept have been compared in terms of cumulative and differential fractions of total dose absorbed as a function of electron energy. The data show that low-energy secondary electrons account for up to nearly 50% of the total dose imparted to a medium when irradiated with electrons or photons.
蒙特卡罗径迹结构方法已被用于阐明低传能线密度(LET)辐射产生的低能电子的重要性。结果表明,这些低能二次电子在所有低LET辐射中对剂量有显著贡献,并且在产生高度局部化的原子损伤簇方面特别有效,而这些损伤簇可能是低LET辐射生物效应的主要部分的原因。基于LET概念的蒙特卡罗径迹结构技术和早期半分析方法所产生的数据,已在作为电子能量函数的总吸收剂量的累积和微分分数方面进行了比较。数据表明,当用电子或光子照射时,低能二次电子占给予介质的总剂量的近50%。