Boruah B R
Department of Physics, Indian Institute of Technology Guwahati, Guwahati-39, Assam, India.
Appl Opt. 2010 Feb 1;49(4):701-7. doi: 10.1364/AO.49.000701.
This article reports the design and implementation of a lateral resolution-enhancement technique in confocal microscopy that can work, in principle, either in the reflection mode or in the fluorescence mode. Taking the difference between two images corresponding to two different vectorially (involving amplitude, phase, and polarization of light) engineered illumination pupils or apertures of a confocal microscope, high spatial frequency contents in the resultant image can be significantly enhanced. This can be realized by incorporating an extra vectorial beam-forming element into the illumination beam path of a conventional confocal microscope. The method of the proposed technique has been explained by giving it an analytical treatment supported by numerical simulation results. The technique has been implemented in a reflection mode confocal microscope and results obtained are presented.
本文报道了一种共聚焦显微镜横向分辨率增强技术的设计与实现，该技术原则上可在反射模式或荧光模式下工作。通过获取对应于共聚焦显微镜两个不同矢量（涉及光的振幅、相位和偏振）工程照明光瞳或孔径的两幅图像之间的差异，合成图像中的高空间频率成分可得到显著增强。这可通过在传统共聚焦显微镜的照明光路中加入一个额外的矢量波束形成元件来实现。通过给出一种分析处理方法并辅以数值模拟结果，对所提技术的方法进行了解释。该技术已在反射模式共聚焦显微镜中实现，并展示了所获得的结果。
