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使用双孔径成像对平面内位移进行莫尔条纹测量。

Moiré gauging of in-plane displacement using double aperture imaging.

作者信息

Duffy D E

出版信息

Appl Opt. 1972 Aug 1;11(8):1778-81. doi: 10.1364/AO.11.001778.

Abstract

An easily implemented method of measuring in-plane surface displacement by photographing an object through two laterally displaced apertures is described and the experimental results are presented. The displacement is displayed as a pattern of moiré fringes over the image. No previously constructed grids or rulings are required as in normal moiré devices. The method is noncontacting and requires no special surface preparation. The sensitivity is easily adjusted and is shown to be equivalent to that obtained using double-exposure holography or speckle pattern interferometry techniques. The method has potential application in mechanically unstable environments or where the conditions are such that grids or strain gauges cannot be attached to the object.

摘要

本文描述了一种通过两个横向位移的孔径对物体进行拍照来测量平面内表面位移的易于实现的方法,并给出了实验结果。位移以莫尔条纹图案的形式显示在图像上。与普通莫尔装置不同,该方法不需要预先构建的网格或刻度。该方法是非接触式的,不需要特殊的表面处理。灵敏度易于调节,并且已证明与使用双曝光全息术或散斑图案干涉测量技术获得的灵敏度相当。该方法在机械不稳定环境或条件不允许在物体上附着网格或应变片的情况下具有潜在应用价值。

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