Hale G M, Holland W E, Querry M R
Appl Opt. 1973 Jan 1;12(1):48-51. doi: 10.1364/AO.12.000048.
Relative specular reflectance R is defined as R = R(s)/R(w), where R(s) and R(w) are absolute reflectances of a sample material s and a material w for which the index of refraction n(w) and the extinction coefficient k(w) are known quantities. An algorithm was developed for computing n(s)and k(s) from the sample's R spectrum measured for radiant flux polarized perpendicular to the plane of incidence and reflected at oblique angle theta. Kramers-Kronig analysis of the R spectrum provides DeltaPhi the difference between phase shifts for electromagnetic waves reflected at the surfaces of materials s and w. Real and imaginary parts of a Fresnel equation for relative reflectivity provide equations for computing n(s) and k(s) when theta, DeltaPhi n(w), and k(w) are known quantities. Optical constants for aqueous solutions containing NaCl were computed in this manner; distilled water was the reflectance standard.
相对镜面反射率R定义为R = R(s)/R(w)，其中R(s)和R(w)分别是样品材料s和材料w的绝对反射率，已知材料w的折射率n(w)和消光系数k(w)。开发了一种算法，用于根据在垂直于入射平面偏振并以倾斜角θ反射的辐射通量测量的样品R光谱来计算n(s)和k(s)。对R光谱进行克喇末-克朗尼格分析可得到ΔΦ，即材料s和w表面反射的电磁波相移之差。当θ、ΔΦ、n(w)和k(w)为已知量时，相对反射率的菲涅耳方程的实部和虚部提供了计算n(s)和k(s)的方程。以这种方式计算了含NaCl水溶液的光学常数；蒸馏水为反射率标准。
