Lesiak Beata, Zemek Josef, Houdkova Jana, Kromka Alexander, Józwik Adam
Institute of Physical Chemistry, Polish Academy of Sciences, Warsaw, Poland.
Anal Sci. 2010;26(2):217-22. doi: 10.2116/analsci.26.217.
The X-ray excited Auger electron spectroscopy (XAES), X-ray photoelectron spectroscopy (XPS) and elastic peak electron spectroscopy (EPES) methods were applied in investigating samples of nanocrystalline diamond and highly oriented pyrolytic graphite of various C sp(2)/sp(3) ratios, crystallinity conditions and grain sizes. The composition at the surface was estimated from the XPS. The C sp(2)/sp(3) ratio was evaluated from the width of the XAES first derivative C KLL spectra and from fitting of XPS C 1s spectra into components. The pattern recognition (PR) method applied for analyzing the spectra line shapes exhibited high accuracy in distinguishing different carbon materials. The PR method was found to be a potentially useful approach for identification, especially important for technological applications in fields of materials engineering and for controlling the chemical reaction products during synthesis.
采用X射线激发俄歇电子能谱（XAES）、X射线光电子能谱（XPS）和弹性峰电子能谱（EPES）方法，对具有不同C sp(2)/sp(3) 比率、结晶条件和晶粒尺寸的纳米晶金刚石和高度取向热解石墨样品进行了研究。通过XPS估算表面成分。根据XAES一阶导数C KLL光谱的宽度以及将XPS C 1s光谱拟合为组分来评估C sp(2)/sp(3) 比率。用于分析谱线形状的模式识别（PR）方法在区分不同碳材料方面表现出高精度。发现PR方法是一种潜在有用的识别方法，对于材料工程领域的技术应用以及合成过程中控制化学反应产物尤为重要。
