Yang De-Quan, Sacher Edward
Regroupement Québécois de Matériaux de Pointe, Département de Génie Physique, Ecole Polytechnique, C.P. 6079, succursale Centre-Ville, Montréal, Québec H3C 3A7, Canada.
Langmuir. 2006 Jan 31;22(3):860-2. doi: 10.1021/la052922r.
C 1s XPS spectra of various highly oriented pyrolytic graphite (HOPG) surfaces, untreated, as well as those treated by keV Ar+ beam bombardment and low-energy O2, N2, Ar, and H2O plasmas, have been systematically studied by comparing two XPS peak-fitting procedures. These procedures treat the spectrum as either (1) the overlap of several symmetric component peaks or (2) a single asymmetric peak. The results indicate that, in the case of HOPG, the asymmetry parameter defining the single peak is directly related to the extent of damage to the alternant hydrocarbon structure of the HOPG surface, as manifested by its correlation with the symmetric peak component due to the damaged HOPG structure.
