An optimization of PIXE procedure for high-Z species in a lower Z matrix.

Singly charged helium ((4)He(+)) induced PIXE technique was used for the elemental analysis of tin mining tailings. The procedure gave very good results especially when a correction was implemented for X-ray absorption in the low-Z region of the spectrum. The use of helium ions to induce X-ray emission was found to be adequate, especially in the case of the intermediate light elements (12<Z<21) where the nuclear reaction sensitivity decreases. Consequently, helium-induced X-ray emission analysis can be usefully applied for trace element detection of low-Z species in a higher Z matrix as well as high-Z species in a lower Z matrix.