低Z基体中高Z元素PIXE分析流程的优化。

An optimization of PIXE procedure for high-Z species in a lower Z matrix.

作者信息

Olise Felix S, Owoade Oyediran K, Olaniyi Hezekiah B

机构信息

Department of Physics, Obafemi Awolowo University, Ile-Ife 220005, Nigeria.

出版信息

Appl Radiat Isot. 2010 Jun;68(6):1030-4. doi: 10.1016/j.apradiso.2010.01.034. Epub 2010 Feb 1.

DOI:10.1016/j.apradiso.2010.01.034

PMID:20149673

Abstract

Singly charged helium ((4)He(+)) induced PIXE technique was used for the elemental analysis of tin mining tailings. The procedure gave very good results especially when a correction was implemented for X-ray absorption in the low-Z region of the spectrum. The use of helium ions to induce X-ray emission was found to be adequate, especially in the case of the intermediate light elements (12<Z<21) where the nuclear reaction sensitivity decreases. Consequently, helium-induced X-ray emission analysis can be usefully applied for trace element detection of low-Z species in a higher Z matrix as well as high-Z species in a lower Z matrix.

摘要

单电荷氦离子（(4)He(+)）诱导粒子激发X射线发射（PIXE）技术被用于锡矿尾矿的元素分析。该方法给出了非常好的结果，特别是当对光谱低Z区域的X射线吸收进行校正时。发现使用氦离子诱导X射线发射是足够的，特别是在核反应灵敏度降低的中等轻元素（12<Z<21）的情况下。因此，氦诱导X射线发射分析可有效地应用于在较高Z基体中检测低Z物种的痕量元素以及在较低Z基体中检测高Z物种。