离子辐射照射对牙科黏结系统黏结强度的影响。

Bond strength of dental adhesive systems irradiated with ionizing radiation.

机构信息

Department of Oral Diagnosis, Dental School of Piracicaba, State University of Campinas, Piracicaba, SP, Brazil.

出版信息

J Adhes Dent. 2010 Apr;12(2):123-8. doi: 10.3290/j.jad.a17530.

DOI:10.3290/j.jad.a17530

PMID:20157673

Abstract

PURPOSE

The aim of the present paper was to determine the effect of different types of ionizing radiation on the bond strength of three different dentin adhesive systems.

MATERIALS AND METHODS

One hundred twenty specimens of 60 human teeth (protocol number: 032/2007) sectioned mesiodistally were divided into 3 groups according to the adhesives systems used: SB (Adper Single Bond Plus), CB (Clearfil SE Bond) and AP (Adper Prompt Self-Etch). The adhesives were applied on dentin and photo-activated using LED (Lec 1000, MMoptics, 1000 mW/cm2). Customized elastomer molds (0.5 mm thickness) with three orifices of 1.2 mm diameter were placed onto the bonding areas and filled with composite resin (Filtek Z-250), which was photo-activated for 20 s. Each group was subdivided into 4 subgroups for application of the different types of ionizing radiation: ultraviolet radiation (UV), diagnostic x-ray radiation (DX), therapeutic x-ray radiation (TX) and without irradiation (control group, CG). Microshear tests were carried out (Instron, model 4411), and afterwards the modes of failure were evaluated by optical and scanning electron microscope and classified using 5 scores: adhesive failure, mixed failures with 3 significance levels, and cohesive failure. The results of the shear bond strength test were submitted to ANOVA with Tukey's test and Dunnett's test, and the data from the failure pattern evaluation were analyzed with the Mann Whitney test (p = 0.05).

RESULTS

No change in bond strength of CB and AP was observed after application of the different radiation types, only SB showed increase in bond strength after UV (p = 0.0267) irradiation. The UV also changed the failure patterns of SB (p = 0.0001).

CONCLUSION

The radio-induced changes did not cause degradation of the restorations, which means that they can be exposed to these types of ionizing radiation without weakening the bond strength.

摘要

目的

本研究旨在确定不同类型电离辐射对三种不同牙本质粘接系统粘结强度的影响。

材料与方法

将 60 个人类牙齿（编号：032/2007）沿颊舌向切割成 120 个样本，根据使用的粘接系统将样本分为 3 组：SB（Adper Single Bond Plus）、CB（Clearfil SE Bond）和 AP（Adper Prompt Self-Etch）。将粘接剂涂于牙本质上，并用 LED （Lec 1000，MMoptics，1000 mW/cm2）光固化。将具有三个直径为 1.2mm 孔的定制弹性体模具（0.5mm 厚）放置在粘结区域上，并填入复合树脂（Filtek Z-250），用 20s 进行光固化。每组进一步分为 4 个亚组，应用不同类型的电离辐射：紫外线辐射（UV）、诊断 X 射线辐射（DX）、治疗 X 射线辐射（TX）和无辐照（对照组，CG）。进行微剪切试验（Instron，型号 4411），然后用光镜和扫描电镜评估失效模式，并使用 5 个等级进行分类：粘结失败、具有 3 个显著性水平的混合失效和内聚性失效。剪切粘结强度试验的结果用方差分析和 Tukey 检验进行分析，失效模式评价的数据用 Mann Whitney 检验进行分析（p = 0.05）。