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一种用于三维显微镜的分辨率测量方法。

A resolution measure for three-dimensional microscopy.

作者信息

Chao Jerry, Ram Sripad, Abraham Anish V, Ward E Sally, Ober Raimund J

机构信息

Department of Electrical Engineering, University of Texas at Dallas, Richardson, TX 75080, USA.

出版信息

Opt Commun. 2009 May 1;282(9):1751-1761. doi: 10.1016/j.optcom.2009.01.062.

Abstract

A three-dimensional (3D) resolution measure for the conventional optical microscope is introduced which overcomes the drawbacks of the classical 3D (axial) resolution limit. Formulated within the context of a parameter estimation problem and based on the Cramer-Rao lower bound, this 3D resolution measure indicates the accuracy with which a given distance between two objects in 3D space can be determined from the acquired image. It predicts that, given enough photons from the objects of interest, arbitrarily small distances of separation can be estimated with prespecified accuracy. Using simulated images of point source pairs, we show that the maximum likelihood estimator is capable of attaining the accuracy predicted by the resolution measure. We also demonstrate how different factors, such as extraneous noise sources and the spatial orientation of the imaged object pair, can affect the accuracy with which a given distance of separation can be determined.

摘要

本文介绍了一种用于传统光学显微镜的三维(3D)分辨率测量方法,该方法克服了经典三维(轴向)分辨率极限的缺点。这种三维分辨率测量方法是在参数估计问题的背景下制定的,并基于克拉美-罗下界,它表示从采集的图像中确定三维空间中两个物体之间给定距离的准确程度。它预测,在从感兴趣的物体获得足够光子的情况下,可以以预先指定的精度估计任意小的分离距离。通过点源对的模拟图像,我们表明最大似然估计器能够达到分辨率测量所预测的精度。我们还展示了不同因素,如外部噪声源和成像物体对的空间取向,如何影响确定给定分离距离的精度。

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