Division of Energy Systems Research, Ajou University, Suwon, Korea.
Nanotechnology. 2010 Mar 19;21(11):115706. doi: 10.1088/0957-4484/21/11/115706. Epub 2010 Feb 22.
We report on electron beam induced current (EBIC) from individual carbon nanotubes (CNTs) which are in contact with metal electrodes. The EBIC signals originate from the diffusion of excess carriers induced by the electron beam bombardment. The EBIC image enables us to locate the individual CNTs efficiently. From the polarity of the EBIC signals we can identify the electrical contacts to the metal electrodes. More importantly, we demonstrate that the EBIC can be used to characterize the local electrical properties of CNT-based devices, such as asymmetry in metal contacts and the presence of defects. EBIC is also observed regardless of the presence of insulating surfaces, indicating that the EBIC is a result of the direct interaction between the CNTs and the electron beams.
我们报告了来自与金属电极接触的单个碳纳米管（CNT）的电子束诱导电流（EBIC）。EBIC 信号源于电子束轰击引起的过剩载流子的扩散。EBIC 图像使我们能够有效地定位单个 CNT。从 EBIC 信号的极性，我们可以确定与金属电极的电接触。更重要的是，我们证明 EBIC 可用于表征基于 CNT 的器件的局部电特性，例如金属接触的不对称性和缺陷的存在。即使存在绝缘表面，也可以观察到 EBIC，这表明 EBIC 是 CNT 与电子束直接相互作用的结果。
