Struttura Complessa Fisica Sanitaria, Azienda Ospedaliera, San Giovanni Battista, Corso Bramante 88, 10126 Torino, Italy.
Med Phys. 2010 Jan;37(1):189-96. doi: 10.1118/1.3271584.
Gafchromic XR-QA films were developed for patient dosimetry in diagnostic radiology. A possible application of these films is the measurement of doses in computed tomography. In this study a method to evaluate the CTDI using Gafchromic XR-QA film and a flatbed scanner was developed and tested. Film samples were cut to dimensions of 6 x 170 mm2 in order to have an integration area similar to that of a pencil ionization chamber, with the possibility of changing the integration length. Prior to exposing these films to a computed tomography beam, the angular dependence of the film dose response was investigated by exposing film strips to a static x-ray beam at different angles in the range 0 degrees-180 degrees. A difference of 49% was found between the response with the axis beam parallel to the film surface (90 degrees) and with the axis beam perpendicular (0 degrees and 180 degrees). Integrating over a 360 degrees exposure like the one in computed tomography, a difference of less than 2% was estimated, which is comparable with the measurement error obtainable with XR-QA film. A calibration with a CT beam in the scout mode was performed and film strips were then exposed to single axial scans and to helical scans both in air and in phantoms. Two different types of flatbed scanners were used to read the film samples, a Microtek ScanMaker 9800XL scanner and an Epson Expression 10000 XL scanner, and the accuracy of the results were compared. For beam collimations above 10 mm differences between CTDI measured by film and CTDI measured by ionization chamber below 9% were found for the Epson scanner, with an average estimated error at 1 sigma level of 5%. For the Microtek scanner and for the same film samples, differences below 11% with an average error at 1 sigma level of 8% were founded. The 1 sigma uncertainty of the measured CTDI was provided by the method for each measurement, and it was shown that about the 95% of the differences between the CTDI measurements with radiochromic films and with the ionization chamber were below the estimated 2 sigma uncertainty, for both scanners. After an accurate calibration procedure and the consideration of the uncertainty associated with the measurement, Gafchromic XR-QA films can be used to evaluate the CTDI.
Gafchromic XR-QA 薄膜是为诊断放射学中的患者剂量测量而开发的。这些薄膜的一个可能应用是测量计算机断层扫描中的剂量。在这项研究中,开发并测试了一种使用 Gafchromic XR-QA 薄膜和平板扫描仪评估 CTDI 的方法。为了使积分面积与铅笔电离室相似,并有可能改变积分长度,将薄膜样品切割成 6 x 170mm2 的尺寸。在将这些薄膜暴露于计算机断层扫描束之前,通过在 0 度至 180 度范围内以不同角度将薄膜条带暴露于静态 X 射线束来研究薄膜剂量响应的角度依赖性。发现与平行于薄膜表面的轴束(90 度)的响应相比,与垂直轴束(0 度和 180 度)的响应之间存在 49%的差异。在像计算机断层扫描那样进行 360 度曝光的积分过程中,估计的差异小于 2%,这与 XR-QA 薄膜的可测量误差相当。在扫描模式下进行了 CT 束校准,然后将薄膜条带暴露于空气和体模中的单个轴向扫描和螺旋扫描。使用两种不同类型的平板扫描仪来读取薄膜样品,一种是 Microtek ScanMaker 9800XL 扫描仪,另一种是 Epson Expression 10000XL 扫描仪,并比较了结果的准确性。对于大于 10mm 的射束准直器,使用 Epson 扫描仪测量的 CTDI 与使用电离室测量的 CTDI 之间的差异小于 9%,在 1 西格玛水平的平均估计误差为 5%。对于 Microtek 扫描仪和相同的薄膜样品,发现差异小于 11%,在 1 西格玛水平的平均误差为 8%。对于每次测量,该方法都提供了所测量的 CTDI 的 1 西格玛不确定性,并且表明对于两种扫描仪,使用放射色薄膜和电离室进行 CTDI 测量之间的差异中约有 95%低于估计的 2 西格玛不确定性。经过准确的校准程序和考虑与测量相关的不确定性后,Gafchromic XR-QA 薄膜可用于评估 CTDI。