Torpey Dana C, Hajcak Greg, Klein Daniel N
Department of Psychology, Stony Brook University, Stony Brook, New York 11794-2500, USA.
Dev Neuropsychol. 2009;34(6):749-61. doi: 10.1080/87565640903265103.
The error-related negativity (ERN) is an event-related brain potential observed in adults when errors are committed, and which appears to be sensitive to error value. Recent work suggests that the ERN can also be elicited in relatively young children using simple tasks and that ERN amplitude might be sensitive to error value. The current study employed a Go No-Go paradigm in which 5-7-year-old children (N = 18) earned low or high points for correct responses. Results indicated that errors were associated with an ERN; however, the size was not reliably moderated by error value.
错误相关负波(ERN)是一种在成年人犯错时观察到的事件相关脑电位,并且似乎对错误值敏感。最近的研究表明,使用简单任务也可以在相对年幼的儿童中诱发ERN,并且ERN波幅可能对错误值敏感。本研究采用了一种“是/否”范式,其中5至7岁的儿童(N = 18)对正确反应可获得低分或高分。结果表明,错误与ERN相关;然而,其大小并未因错误值而得到可靠调节。