Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Drive, MC 0407, La Jolla, California 92093-0407, USA.
Opt Lett. 2010 Mar 1;35(5):784-6. doi: 10.1364/OL.35.000784.
There is considerable research activity in multiresonator optical circuits in silicon photonics, e.g., for higher-order filters, advanced modulation format coding/decoding, or coupled-resonator optical waveguide delay lines. In diagnostics of such structures, it is usually not possible to measure each individual microring resonator without adding separate input and output waveguides to each resonator. We demonstrate a non-invasive diagnostic method of quantitative IR imaging, applied here to a series cascade of rings. The IR images contain information on the otherwise inaccessible individual through ports and the resonators themselves, providing an efficient means to obtain coupling, loss, and intensity-enhancement parameters for the individual rings.
在硅光子学中的多谐振器光学电路中有相当多的研究活动，例如，用于高阶滤波器、先进的调制格式编码/解码或耦合谐振器光波导延迟线。在这种结构的诊断中，通常不可能在不向每个谐振器添加单独的输入和输出波导的情况下测量每个单独的微环谐振器。我们展示了一种非侵入式的定量红外成像诊断方法，这里应用于一系列级联的环。红外图像包含了通常无法访问的各个直通端口和谐振器本身的信息，为获得各个环的耦合、损耗和强度增强参数提供了一种有效的手段。
