Max-Planck-Institut fur Festkorperforschung, Stuttgart, Germany.
Nano Lett. 2010 Apr 14;10(4):1144-8. doi: 10.1021/nl9031617.
Using high resolution transmission electron microscopy, we identify the specific atomic scale features in chemically derived graphene monolayers that originate from the oxidation-reduction treatment of graphene. The layers are found to comprise defect-free graphene areas with sizes of a few nanometers interspersed with defect areas dominated by clustered pentagons and heptagons. Interestingly, all carbon atoms in these defective areas are bonded to three neighbors maintaining a planar sp(2)-configuration, which makes them undetectable by spectroscopic techniques. Furthermore, we observe that they introduce significant in-plane distortions and strain in the surrounding lattice.
利用高分辨率透射电子显微镜，我们在化学衍生的石墨烯单层片中识别出源自石墨烯氧化还原处理的特定原子尺度特征。这些层由无缺陷的石墨烯区域组成，大小为数纳米，散布有缺陷区域，这些缺陷区域主要由五边形和七边形的团簇组成。有趣的是，这些有缺陷区域中的所有碳原子都与三个相邻原子键合，保持平面 sp(2)构型，这使得它们无法通过光谱技术检测到。此外，我们观察到它们在周围晶格中引入了显著的面内扭曲和应变。
