Stansberg C T
Appl Opt. 1979 Dec 1;18(23):4051-60. doi: 10.1364/AO.18.004051.
A new method for surface roughness measurements is described based on the fibrous, roughness-dependent structure of polychromatic speckle patterns in the far field. The patterns are recorded on photographic film and analyzed by an optical Fourier transform system with a double aperture in the film plane. We have calculated the theoretical roughness dependence of a parameter in the Fourier spectrum. Our experimental results agree fairly well with the theory.
本文描述了一种基于远场多色散斑图案的纤维状、依赖粗糙度的结构进行表面粗糙度测量的新方法。这些图案记录在摄影胶片上，并通过在胶片平面上具有双孔径的光学傅里叶变换系统进行分析。我们已经计算出了傅里叶光谱中一个参数的理论粗糙度依赖性。我们的实验结果与理论相当吻合。
