Josse M, Kendall D L
Appl Opt. 1980 Jan 1;19(1):72-6. doi: 10.1364/AO.19.000072.
Diffraction gratings having well-shaped rectangular profiles were fabricated by chemical etching of single-crystal silicon oriented in the ?110? direction. The grooves were 2.62 microm deep, 5.4 microm wide, and were separated by 10.2 microm. The diffraction behavior was measured near normal incidence using several laser wave-lengths. The specularly reflected (zero-order) beam varied by a factor of at least 140 at different visible wavelengths, thereby demonstrating the excellent geometric form of the structures.
通过对沿<110>方向取向的单晶硅进行化学蚀刻,制备出具有形状良好的矩形轮廓的衍射光栅。这些沟槽深2.62微米,宽5.4微米,间距为10.2微米。使用几种激光波长在近正入射条件下测量了衍射行为。在不同可见光波长下,镜面反射(零级)光束的变化因子至少为140,从而证明了这些结构具有优异的几何形状。