Kitajima H, Hieda K, Suematsu Y
Appl Opt. 1981 Mar 15;20(6):1005-10. doi: 10.1364/AO.20.001005.
In this paper the optimum condition for using the attenuated total reflection (ATR) technique is studied. In optimum conditions, the energy of an incident plane wave can be totally absorbed. The optimum condition can be realized by fabricating a localized thickness variation in the gap between a prism and a sample substrate with a point contact pressure. In the ATR technique, for example, the complex refractive index and the foil thickness of a thin metal foil, and the gap thickness are unknown parameters. To determine these unknown parameters, we prepared three prism coupling systems with different refractive indices. By this technique, we measured the complex refractive indices and the foil thicknesses of thin gold foils sputtered onto glass substrates, and the refractive index and the film thickness of a silica film sputtered onto a metal substrate.
本文研究了使用衰减全反射（ATR）技术的最佳条件。在最佳条件下，入射平面波的能量可以被完全吸收。通过在棱镜和样品基板之间的间隙中制造具有点接触压力的局部厚度变化，可以实现最佳条件。例如，在ATR技术中，薄金属箔的复折射率和箔厚度以及间隙厚度是未知参数。为了确定这些未知参数，我们制备了三个具有不同折射率的棱镜耦合系统。通过这种技术，我们测量了溅射在玻璃基板上的薄金箔的复折射率和箔厚度，以及溅射在金属基板上的二氧化硅膜的折射率和膜厚度。
