Eriksson T S, Hjortsberg A, Niklasson G A, Granqvist C G
Appl Opt. 1981 Aug 1;20(15):2742-6. doi: 10.1364/AO.20.002742.
The dielectric function epsilon identical with epsilon(1) + iepsilon(2) has been determined for Al(2)O(3) films prepared by electron beam evaporation, in the 5-50-microm wavelength range. The data were extracted from spectrophotometric recordings of transmittance and reflectance by use of a novel technique. Supplementary measurements were made of the refractive index for visible and near-infrared wavelengths and of the dielectric constant at 1 MHz. Kramers-Kronig analysis was employed to check the consistency of our results for epsilon(1) and epsilon(2).
已通过一种新技术，在5 - 50微米波长范围内测定了通过电子束蒸发制备的Al₂O₃薄膜的介电函数ε（ε = ε₁ + iε₂）。数据是从透射率和反射率的分光光度记录中提取的。还对可见光和近红外波长的折射率以及1 MHz时的介电常数进行了补充测量。采用克喇末 - 克朗尼格分析来检验我们得到的ε₁和ε₂结果的一致性。
