Samsung Advanced Institute of Technology, Mt. 14, Gyeonggi-Do, Korea.
Nano Lett. 2010 May 12;10(5):1671-6. doi: 10.1021/nl904282v.
We investigate peculiar dopant deactivation behaviors of Si nanostrucures with first principle calculations and reveal that surface dangling bonds (SDBs) on Si nanostructures could be fundamental obstacles in nanoscale doping. In contrast to bulk Si, as the size of Si becomes smaller, SDBs on Si nanostructures prefer to be charged and asymmetrically deactivate n- and p-type doping. The asymmetric dopant deactivation in Si nanostructures is ascribed to the preference for negatively charged SDBs as a result of a larger quantum confinement effect on the conduction band. On the basis of our results, we show that the control of the growth direction of silicon nanowire as well as surface passivation is very important in preventing dopant deactivation.
我们通过第一性原理计算研究了硅纳米结构中特殊的掺杂剂失活行为,并揭示了表面悬挂键(SDB)是纳米尺度掺杂的基本障碍。与体硅相比,随着硅尺寸的减小,硅纳米结构上的 SDB 更容易被带电并不对称地使 n 型和 p 型掺杂失活。硅纳米结构中不对称的掺杂剂失活归因于导带的量子限制效应导致带负电的 SDB 更倾向于被占据。基于我们的结果,我们表明控制硅纳米线的生长方向和表面钝化对于防止掺杂剂失活非常重要。