Fukamachi Tomoe, Tohyama Masahiko, Hirano Kenji, Yoshizawa Masami, Negishi Riichirou, Ju Dongying, Hirano Keiichi, Kawamura Takaaki
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293, Japan.
Acta Crystallogr A. 2010 May;66(Pt 3):421-6. doi: 10.1107/S0108767310006148. Epub 2010 Apr 16.
Interference fringes are measured in the diffraction from the surface as well as from the lateral surface of an Si single-crystal strip which is deformed in cantilever bending as a function of the tip displacement. The interference fringes are observed only when the bending strain is applied. Both interference fringes change conspicuously by increasing the bending strain. The number of the interference fringes changes, and the positions and heights of the peaks in the fringes change. These variations can be explained by the change of the interference between the beams in multiple Bragg-Laue modes and those of mirage diffraction based on the dynamical theory of diffraction.
在作为针尖位移函数的悬臂弯曲中发生变形的硅单晶条带的表面以及侧面的衍射中测量干涉条纹。仅当施加弯曲应变时才观察到干涉条纹。通过增加弯曲应变，两种干涉条纹都会显著变化。干涉条纹的数量发生变化，条纹中峰值的位置和高度也发生变化。基于衍射动力学理论，这些变化可以通过多布拉格 - 劳厄模式下光束之间干涉的变化以及蜃景衍射的变化来解释。
