POLICOM-Dipartimento di Elettronica e Informazione, Politecnico di Milano, Via Ponzio 34/5, 20133, Milano, Italy.
Opt Lett. 2010 Jun 1;35(11):1777-9. doi: 10.1364/OL.35.001777.
The statistics of backscattering induced by sidewall roughness in dielectric optical waveguides is experimentally investigated. We demonstrate that waveguide backscattering is a wavelength-dependent random process, whose statistics follows the rules of single scattering systems, independently of shape, size, and refractive index contrast of the waveguide, and of the light polarization state. The intensity of backscattering is distributed according to an exponential probability density function, and its mean delay corresponds to a reflection at half the effective length of the waveguide.
实验研究了介质光波导侧壁粗糙引起的反向散射的统计特性。我们证明了波导反向散射是一个波长相关的随机过程，其统计特性遵循单散射系统的规律，与波导的形状、尺寸和折射率对比度以及光的偏振态无关。反向散射的强度按照指数概率密度函数分布，其平均延迟对应于有效波导长度的一半处的反射。
