Interfacial trap density-of-states in pentacene- and ZnO-based thin-film transistors measured via novel photo-excited charge-collection spectroscopy.
作者信息
Lee Kimoon, Oh Min Suk, Mun Sung-jin, Lee Kwang H, Ha Tae Woo, Kim Jae Hoon, Park Sang-Hee Ko, Hwang Chi-Sun, Lee Byoung H, Sung Myung M, Im Seongil
机构信息
Institute of Physics and Applied Physics, Yonsei University, Seodaemun-gu, Seoul, Korea.
出版信息
Adv Mater. 2010 Aug 10;22(30):3260-5. doi: 10.1002/adma.201000722.
PMID:20518045
Abstract
摘要
Zotero 插件