时间和波长分辨电作用力显微镜对多晶并五苯中带电缺陷的光谱特性研究。
Spectroscopic characterization of charged defects in polycrystalline pentacene by time- and wavelength-resolved electric force microscopy.
机构信息
Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY 14853-1301, USA.
出版信息
Adv Mater. 2011 Feb 1;23(5):624-8. doi: 10.1002/adma.201003073. Epub 2010 Dec 6.
PMID:21274909
Abstract
Spatial maps of topography and trapped charge are acquired for polycrystalline pentacene thin-film transistors using electric and atomic force microscopy. In regions of trapped charge, the rate of trap clearing is studied as a function of the wavelength of incident radiation.
摘要
使用电子和原子力显微镜获取多晶 pentacene 薄膜晶体管的形貌和俘获电荷的空间图。在俘获电荷的区域中，研究了俘获清除率随入射辐射波长的变化。
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