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[纳米二氧化钒薄膜的电学和光学相变特性]

[Electrical and optical phase transition properties of nano vanadium dioxide thin films].

作者信息

Liang Ji-Ran, Hu Ming, Wang Xiao-Dong, Li Gui-Ke, Kan Qiang, Ji An, Yang Fu-Hua, Liu Jian, Wu Nan-Jian, Chen Hong-Da

机构信息

College of Electronic Science and Technology, School of Electronic and Information Engineering, Tianjin University, Tianjin 300072, China.

出版信息

Guang Pu Xue Yu Guang Pu Fen Xi. 2010 Apr;30(4):1002-7.

Abstract

Nano-vanadium dioxide thin films were prepared through thermal annealing vanadium oxide thin films deposited by dual ion beam sputtering. The nano-vanadium dioxide thin films changed its state from semiconductor phase to metal phase through heating by homemade system. Four point probe method and Fourier transform infrared spectrum technology were employed to measure and anaylze the electrical and optical semiconductor-to-metal phase transition properties of nano-vanadium dioxide thin films, respectively. The results show that there is an obvious discrepancy between the semiconductor-to-metal phase transition properties of electrical and optical phase transition. The nano-vanadium dioxide thin films' phase transiton temperature defined by electrical phase transiton property is 63 degrees C, higher than that defined by optical phase transiton property at 5 microm, 60 degrees C; and the temperature width of electrical phase transition duration is also wider than that of optical phase transiton duration. The semiconductor-to-metal phase transiton temperature defined by optical properties increases with increasing wavelength in the region of infrared wave band, and the occuring temperature of phase transiton from semiconductor to metal also increases with wavelength increasing, but the duration temperature width of transition decreases with wavelength increasing. The phase transition properties of nano-vanadium dioxide thin film has obvious relationship with wavelength in infrared wave band. The phase transition properties can be tuned through wavelength in infrared wave band, and the semiconductor-to-metal phase transition properties of nano vanadiium dioxide thin films can be better characterized by electrical property.

摘要

通过对双离子束溅射沉积的氧化钒薄膜进行热退火制备了纳米二氧化钒薄膜。纳米二氧化钒薄膜通过自制系统加热,其状态从半导体相转变为金属相。分别采用四点探针法和傅里叶变换红外光谱技术来测量和分析纳米二氧化钒薄膜的电学和光学半导体-金属相变特性。结果表明,电学相变和光学相变的半导体-金属相变特性之间存在明显差异。由电学相变特性定义的纳米二氧化钒薄膜的相变温度为63℃,高于在5微米波长处由光学相变特性定义的60℃;电学相变持续时间的温度宽度也比光学相变持续时间的宽。在红外波段区域,由光学性质定义的半导体-金属相变温度随波长增加而升高,从半导体到金属的相变发生温度也随波长增加而升高,但转变的持续温度宽度随波长增加而减小。纳米二氧化钒薄膜的相变特性与红外波段的波长有明显关系。相变特性可通过红外波段的波长进行调节,纳米二氧化钒薄膜的半导体-金属相变特性用电学性质能更好地表征。

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